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论文类型：期刊论文

发表时间：2019-02-01

发表刊物：FUSION ENGINEERING AND DESIGN

收录刊物：SCIE、EI

卷号：139

页面范围：96-103

ISSN号：0920-3796

关键字：Plasma-facing materials; Tungsten; Helium ion irradiation

摘要：The interaction between the impurities (such as carbon, nitrogen, oxygen) and the plasma-facing materials (PFMs) can profoundly influence the performance and service of the PFMs. In this paper, we investigated the influence of oxygen (O-2) impurity in the helium radio frequency (RF) plasma on the surface morphology of polycrystalline tungsten (W) irradiated at the surface temperature of 1450 +/- 50 K and the ion energy of 100 eV. The pressure ratio of O-2 to He (R) in RF source varied from 4.0 x 10(-6) to 9.0 x 10(-2). The total irradiation flux and fluence were (similar to)1.2 x 10(22) ions.m(-2).s(-1) and (similar to)1.0 x 10(26) ions.m(-2), respectively. After He+ irradiation, the specimen surface morphology was observed by scanning electron microscopy. It was found that with increasing R from 4.0 x 10(-6) to 9.0 x 10(-2) the thickness of nano-fuzz layer at the W surface was thinner and thinner, accompanied by the formation of rod-like structures. The erosion yield increased from 5.2 x 10(-4) to 2.3 x 10(-2) W/ion when R varied from 4.0 x 10(-6) to 9.0 x 10(-2) . The X-ray diffraction analysis shows that tungsten oxides were formed at the near surface of specimens when R exceeded 1.8 x 10(-2) . The erosion yield measurements revealed that in addition to surface physical sputtering process, the chemical erosion process could occur due to the interaction between oxygen-containing species and W at the surface. The results indicated that the presence of O-2 impurity in He plasma can obviously affect the surface microstructure of W. The study suggested that O-2 impurity can effectively reduce the growth of nano-fuzz structures.