Liu Dongping
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Tensile stress-driven cracking of W fuzz over W crystal under fusion-relevant He ion irradiations
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Indexed by:Journal Papers

Date of Publication:2020-04-01

Journal:NUCLEAR FUSION

Included Journals:SCIE

Volume:60

Issue:4

ISSN No.:0029-5515

Key Words:tensile stress; ion irradiations; W fuzz; He bubble

Abstract:Although W fuzz is formed in the divertor region of the fusion reactor, no theory may clearly explain the W fuzz growth mechanism. In this study, we observe the growth process of W fuzz over W crystal under ITER-relevant He ion irradiations. We propose the tensile stress-driven cracking of nano-structured fuzz during the initial growth of W fuzz. We demonstrate that the existence of tensile stress is due to the swelling of He nano-bubbles in the fuzz. After this cracking, the W fuzz breaks away from the planar network and grows over the W surface, where the micro-stress in the W surface layer acts as the driving force.

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Senior Engineer
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates

Gender:Male

Date of Birth:1971-11-24

Alma Mater:Dalian University of Technology

Degree:Doctoral Degree

School/Department:School of Electrical Engineering

Discipline:Theory and New Technology of Electrical Engineering

Business Address:School of Electrical Engineering, Dalian University of Technology, No.2 Linggong Road, Ganjingzi District, Dalian City, Liaoning Province, China

Contact Information:dpliu@dlut.edu.cn

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Address: No.2 Linggong Road, Ganjingzi District, Dalian City, Liaoning Province, P.R.C., 116024

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