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Indexed by:会议论文

Date of Publication:2017-01-01

Included Journals:CPCI-S

Volume:2017-December

Page Number:157-160

Key Words:vacuum arc; AMF arc control; post arc current; mutli-break VCBs

Abstract:The paper investigates the pulsed AMF arc control on the vacuum arc and the post arc characteristic to reveal the mechanism of AMF arc control in different control time and find the proper AMF arc control. The pulsed AMF control system is designed and the pulse width is adjusting from 1.5ms to 10ms. The test circuit is set up in the synthetic test and the test VI is transparency in order to observe the development of the vacuum arc by the high speed CMOS camera. The rated voltage and current of the test VI is 10kV and 25kA respectively. The post arc current of the test VI is measured to analyze the post arc characteristic, such as post arc charge, post arc conductance and dynamic dielectric strength. The developing process of vacuum arc and the post arc characteristic influenced by the pulse width, magnitude and control time of the pulsed AMF is obtained, which is useful to special magnetic contacts design.