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Date of Publication:2022-10-06

Journal:IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE

Volume:43

Issue:7

Page Number:2400-2412

ISSN No.:0162-8828

Key Words:"Strain; Lighting; Estimation; Benchmark testing; Imaging; Robustness; Visualization; Cross-modal correspondence; pyramidal structure; self-correlation; local self-similarity; non-rigid deformation"