Release Time:2022-10-06 Hits:
Date of Publication: 2022-10-06
Journal: IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
Volume: 43
Issue: 7
Page Number: 2400-2412
ISSN: 0162-8828
Key Words: "Strain; Lighting; Estimation; Benchmark testing; Imaging; Robustness; Visualization; Cross-modal correspondence; pyramidal structure; self-correlation; local self-similarity; non-rigid deformation"