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Aberration-aware 3D localization microscopy via self-supervised neural-physics learning

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  • Indexed by:Journal Papers

  • Document Code:602623

  • Date of Publication:2026-05-16

  • Journal:NATURE COMMUNICATIONS

  • Volume:17

  • Issue:1

  • Key Words:ACCURACY; NANOSCOPY; RESOLUTION; SUPERRESOLUTION; TRACKING; WHOLE-CELL

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