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Dynamic Memory Event-Triggered Anti-Disturbance Control for Switched Cyber-Physical Systems and Its Application to Switched RLC Circuit
2025-01-03 Hits:Indexed by:Journal Papers
Document Code:470912
Date of Publication:2024-12-01
Journal:IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
Volume:71
Issue:12
Page Number:6034-6043
ISSN:1549-8328
Niu Ben
Date of Birth:1982-05-02
Gender:Male
Alma Mater:东北大学
Degree:Doctoral Degree
School/Department:控制科学与工程学院
Business Address:大连市甘井子区凌工路2号-大连理工大学海山楼
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