个人信息Personal Information
教授
博士生导师
硕士生导师
性别:女
毕业院校:大连理工大学
学位:博士
所在单位:信息与通信工程学院
办公地点:海山楼A420
联系方式:lslwf@dlut.edu.cn
电子邮箱:lslwf@dlut.edu.cn
Automatic inspection of small component on loaded PCB based on SVD
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论文类型:会议论文
发表时间:2006-08-15
收录刊物:EI、CPCI-S、Scopus
卷号:6315
关键字:printed circuit board; singular value decomposition; support vector machine
摘要:Automatic inspection of small components on loaded Printed Circuit Board (PCB) is difficult due to the requirements of precision and high speed. In this paper, an automatic inspection method is presented based on Singular Value Decomposition (SVD) and Support Vector Machine (SVM). For the image of loaded PCB, we use prior location of component to get approximate region of the small component. Then the accurate numeral region of the small component can be segmented by using the projection data of this region. Next, Singular Values (SVs) of the numeral region can be obtained through SVD of the gray image. These SVs are used as the features of small component to train a SVM classifier. Then, the automatic inspection can be completed by using trained SVM classifier. The method based on projection data can overcome some difficulties of traditional method using connected domain, and reduce complexity of template matching. The SVD avoids using binary image to analyze the numerals, so the numeral information is retained as much as possible. Finally, the experimental results prove that the method in this paper is effective and feasible to some extent.