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论文类型：期刊论文

发表时间：2019-12-01

发表刊物：RELIABILITY ENGINEERING & SYSTEM SAFETY

收录刊物：SCIE

卷号：192

期号：,SI

ISSN号：0951-8320

关键字：D matrix; Fault detection and isolation (FDI); Growing algorithm; Optimal test sequence; Sequential fault diagnosis

摘要：Test sequencing for binary systems is an NP-complete problem. In this study, we introduce a novel algorithm for this problem, which is defined as a growing algorithm. This algorithm chooses the failure states and finds a suitable test set for the selected failure states. This can avoid the backtracking approach of the traditional algorithms. Three main procedures are presented to illustrate the growing algorithm: (1) a test sequencing problem is simplified as a combinatorial problem comprising a basic test set with unnecessary tests; (2) the optimal test sequence generating algorithm (OTSGA) is proposed for an individual failure state; and (3) the priority levels of the failure states are determined based on their prior probabilities. Finally, a circuit system is used to show how the growing algorithm works, and five real-word D matrices are employed to validate the universality and stability of the algorithm. Subsequently, the application scope for the growing algorithm is demonstrated in detail by stochastic simulation experiments. This growing algorithm is suitable for large-scale systems with a sparse D matrix, and it obtains good calculation results with a short running time and high efficiency.