期刊论文

Zhou C.

Zhou, C.; School of Electrical Engineering, Dalian University of Technology, Dalian, China; email: drea7126@sina.com

Wang Z.,Li G.

2012-05-01

Journal of Convergence Information Technology

EI、Scopus

J

7

8

44-53

19759320

This paper deals with the application of integral values of dielectric spectroscopy as the characteristic values from 10 -2Hz to 1Hz for estimating the lifetime of low-voltage ethylene propylene rubber(EPR) insulation cables aging in the lab. The elongation-at-break and the dielectric dissipation factor (tan  ) were measured to study the characteristics of curve and to analyze sensitive measurement range. Based on the failure criterion of elongation-at-break, the correlation between the mechanical and dissipation curve was investigated and the effectiveness among three ways to assume values of dielectric dissipation factor was compared. Meanwhile, a time multiplicative shift factor was found with the same characteristics value at different aging temperatures and a prediction equation after selected reference temperature was obtained. Combined with integral equation of the deterioration tendency under reference temperature, a life model of dielectric dissipation factor integral for insulation material was derived. Results showed that testing parameters on integral value of tan   had a contrary tendency with elongation-at-break and reflected the degradation trend in sensitive range within 10 -2Hz~1Hz. Compared life model calculation results with measurements of cable in field, the measurement error was 3.33%. It had been found that this method could effectively evaluate the aging lifetime of low-voltage cable EPR insulation materials.