NAME

王志强

Paper Publications

Application of low frequency dielectric spectroscopy to estimate lifetime of low-voltage EPR insulation
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  • Indexed by:

    期刊论文

  • First Author:

    Zhou C.

  • Correspondence Author:

    Zhou, C.; School of Electrical Engineering, Dalian University of Technology, Dalian, China; email: drea7126@sina.com

  • Co-author:

    Wang Z.,Li G.

  • Date of Publication:

    2012-05-01

  • Journal:

    Journal of Convergence Information Technology

  • Included Journals:

    EI、Scopus

  • Document Type:

    J

  • Volume:

    7

  • Issue:

    8

  • Page Number:

    44-53

  • ISSN No.:

    19759320

  • Abstract:

    This paper deals with the application of integral values of dielectric spectroscopy as the characteristic values from 10 -2Hz to 1Hz for estimating the lifetime of low-voltage ethylene propylene rubber(EPR) insulation cables aging in the lab. The elongation-at-break and the dielectric dissipation factor (tan  ) were measured to study the characteristics of curve and to analyze sensitive measurement range. Based on the failure criterion of elongation-at-break, the correlation between the mechanical and dissipation curve was investigated and the effectiveness among three ways to assume values of dielectric dissipation factor was compared. Meanwhile, a time multiplicative shift factor was found with the same characteristics value at different aging temperatures and a prediction equation after selected reference temperature was obtained. Combined with integral equation of the deterioration tendency under reference temperature, a life model of dielectric dissipation factor integral for insulation material was derived. Results showed that testing parameters on integral value of tan   had a contrary tendency with elongation-at-break and reflected the degradation trend in sensitive range within 10 -2Hz~1Hz. Compared life model calculation results with measurements of cable in field, the measurement error was 3.33%. It had been found that this method could effectively evaluate the aging lifetime of low-voltage cable EPR insulation materials.

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