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Indexed by:期刊论文

Date of Publication:2012-05-01

Journal:Journal of Convergence Information Technology

Included Journals:EI、Scopus

Volume:7

Issue:8

Page Number:44-53

ISSN No.:19759320

Abstract:This paper deals with the application of integral values of dielectric spectroscopy as the characteristic values from 10 -2Hz to 1Hz for estimating the lifetime of low-voltage ethylene propylene rubber(EPR) insulation cables aging in the lab. The elongation-at-break and the dielectric dissipation factor (tan  ) were measured to study the characteristics of curve and to analyze sensitive measurement range. Based on the failure criterion of elongation-at-break, the correlation between the mechanical and dissipation curve was investigated and the effectiveness among three ways to assume values of dielectric dissipation factor was compared. Meanwhile, a time multiplicative shift factor was found with the same characteristics value at different aging temperatures and a prediction equation after selected reference temperature was obtained. Combined with integral equation of the deterioration tendency under reference temperature, a life model of dielectric dissipation factor integral for insulation material was derived. Results showed that testing parameters on integral value of tan   had a contrary tendency with elongation-at-break and reflected the degradation trend in sensitive range within 10 -2Hz~1Hz. Compared life model calculation results with measurements of cable in field, the measurement error was 3.33%. It had been found that this method could effectively evaluate the aging lifetime of low-voltage cable EPR insulation materials.