Release Time:2019-03-11  Hits:

Indexed by: Journal Article

Date of Publication: 2012-05-01

Journal: Journal of Convergence Information Technology

Included Journals: Scopus、EI

Volume: 7

Issue: 8

Page Number: 44-53

ISSN: 19759320

Abstract: This paper deals with the application of integral values of dielectric spectroscopy as the characteristic values from 10 -2Hz to 1Hz for estimating the lifetime of low-voltage ethylene propylene rubber(EPR) insulation cables aging in the lab. The elongation-at-break and the dielectric dissipation factor (tan  ) were measured to study the characteristics of curve and to analyze sensitive measurement range. Based on the failure criterion of elongation-at-break, the correlation between the mechanical and dissipation curve was investigated and the effectiveness among three ways to assume values of dielectric dissipation factor was compared. Meanwhile, a time multiplicative shift factor was found with the same characteristics value at different aging temperatures and a prediction equation after selected reference temperature was obtained. Combined with integral equation of the deterioration tendency under reference temperature, a life model of dielectric dissipation factor integral for insulation material was derived. Results showed that testing parameters on integral value of tan   had a contrary tendency with elongation-at-break and reflected the degradation trend in sensitive range within 10 -2Hz~1Hz. Compared life model calculation results with measurements of cable in field, the measurement error was 3.33%. It had been found that this method could effectively evaluate the aging lifetime of low-voltage cable EPR insulation materials.