YongXin Liu
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Improved Double-Probe Technique for Spatially Resolved Diagnosis of Dual-Frequency Capacitive Plasmas
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Indexed by:期刊论文

Date of Publication:2013-06-01

Journal:PLASMA SCIENCE & TECHNOLOGY

Included Journals:SCIE、EI、Scopus

Volume:15

Issue:6

Page Number:511-515

ISSN No.:1009-0630

Key Words:dual-frequency capacitive plasma; double probe; plasma diagnosis

Abstract:The conventional double-probe technique was improved with a combination of self-powering and radio-frequency (RF) choking. RF perturbations in dual-frequency capacitively coupled discharge were effectively eliminated, as judged by the disappearance of self-bias on the probes. The improved technique was tested by spatially resolved measurements of the electron temperature and ion density in both the axial and radial directions of a dual-frequency capacitive plasma. The measured data in the axial direction were compared with simulation results, and they were excellently consistent with each other. The measured radial distributions of the ion density and electron temperature were influenced significantly by the lower frequency (LF) power. It was shown that superposition of the lower frequency to the higher frequency (HF) power shifted the maximum ion density from the radial center to the edge region, while the trend for the electron temperature profile was the opposite. The changing feature of the ion density distribution is qualitatively consistent with that of the optical emission intensity reported.

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Gender:Male

Alma Mater:大连理工大学

Degree:Doctoral Degree

School/Department:物理学院

Discipline:Plasma physics

Business Address:大连理工大学三束材料改性教育部重点实验室3号楼201室

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