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发表时间：2010-01-01

发表刊物：光学学报

所属单位：运载工程与力学学部

卷号：30

期号：10

页面范围：2776-2781

ISSN号：0253-2239

摘要：Lock-in infrared thermography method is gradually used in fatigue
   studies because of its advantages such as real-time, quick-reaction,
   non-destructive, non-contact and so on. Non-destructive testing is
   applied to fatigue specimen with defects, and the fatigue limit is
   detected rapidly based on lock-in infrared thermography. In parallel,
   the results are analyzed using lock-in infrared thermography system
   developed by Cedip in French. It shows that more information of internal
   detects can be found from phase image than from amplitude image. The
   experimental procedure indicates that a proper testing frequency is the
   key to the non-destructive testing. The datas reveale that larger area
   of defect leads to a precise testing result and the fatigue limit of the
   specimen decreases with the increase of the defect depth

备注：新增回溯数据