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基于声压反射系数功率谱测量超声在薄层介质中往返时间的方法

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First Author:Lin Li

Disigner of the Invention:胡志雄,chenjun,LUO Zhongbing,liximeng

Affilication of Author(s):材料科学与工程学院

Application Number:CN102607479A

Authorization number:CN201210051117.3

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