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基于TRL相控阵探头的缺陷3D可视化超声检测流程

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First Author:王婧云

Disigner of the Invention:chenjun,jinshijie,张侃,LUO Zhongbing,Lin Li

Application Number:CN105044211A

Authorization number:CN201510383301.1

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Next One:基于声压反射系数功率谱测量超声在薄层介质中往返时间的方法
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