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一种提高碳化硅半导体欧姆接触特性的方法

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First Author:Dejun WANG

Disigner of the Invention:Qin Fuwen,黄玲琴,李青洙

Affilication of Author(s):电子信息与电气工程学部

Application Number:CN105702712A

Authorization number:CN201610066721.1

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