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Influence of boron contents on the structure and hardness properties of Al-Mg-B films by R.F. magnetron sputtering

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Indexed by:期刊论文

Date of Publication:2012-01-01

Journal:Rare Matels

Volume:31

Issue:2

Page Number:164-167

Pre One:Research on Ti-Si-N films prepared by magnetron sputtering

Next One:Effect of buffer layer on the structural and morphological properties of GaN films grown with ECR-PEMOCVD
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