- The growth behaviors of IMC layers at soldered and diffusion bonding Sn/Cu interfaces and the effects of high magnetic field
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- 论文类型： 会议论文
- 发表时间： 2008-01-01
- 收录刊物： EI、CPCI-S
- 卷号： 373-374
- 页面范围： 480-483
- 关键字： IMC layers; aging; growth behaviors; high magnetic field
- 摘要： The growth behaviors of intermetallic compound (IMC) layers in soldered and diffusion bonding Sn/Cu joints and the effects of magnetic field have been investigated. The results indicate that, without high magnetic field, the growth behaviors of these two IMC layers are similar in the aging except the initial morphologies. However, the morphologies and crystal orientations of these two IMC layers have changed after being aged in high magnetic field.
