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论文类型：期刊论文

发表时间：2012-01-01

发表刊物：Advanced Science Letters

收录刊物：Scopus

卷号：5

期号：2

页面范围：593-596

ISSN号：19366612

摘要：In this paper, a non-destructive testing of grid stiffened composite structure with typical defects is presented based on the lock-in infrared thermography technology. The results are analyzed using lock-in infrared thermography system developed by Cedip in France. The effects of loading frequency and output voltage offset on test results are discussed. However, it is shown that the position and shape of the defects could be inspected, but not clear at the boundary. The proper loading frequency should be chosen for different attributes of materials and types of defects. And to increasing the output voltage offset is also good for the test. This method is feasible to inspect the unknown defect of composite materials. ? 2012 American Scientific Publishers All rights reserved.