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一种在nanoLOC测距系统中利用RSSI降低多径误差的方法

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First Author:zhaotaiyang

Disigner of the Invention:Chengan Guo,lixiaobing,王宇,杨清山

Affilication of Author(s):电子信息与电气工程学部

Application Number:CN102523592A

Authorization number:CN201110404503.1

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