Current position: Home >> Scientific Research >> Patents

一种在nanoLOC测距系统中利用RSSI降低多径误差的方法

Release Time:2022-10-20  Hits:

First Author: 赵泰洋

Disigner of the Invention: Chengan Guo,李小兵,王宇,杨清山

Institution: 电子信息与电气工程学部

Application Number: CN102523592A

Authorization Number: CN201110404503.1

Prev One:一种雷达装备印制电路板自动检测平台

Next One:高压共轨关键部件自动检测诊断系统
Recommended Ph.D.Supervisor Recommended MA Supervisor Institutional Repository Personal Page

Address: No.2 Linggong Road, Ganjingzi District, Dalian City, Liaoning Province, P.R.C., 116024

Click:Times MOBILE Version
The Founding Time : ..
The Last Update Time : ..

Mobile phone sweep