Current position: Home >> Scientific Research >> Patents

基于声压反射系数功率谱测量薄层声阻抗的方法

Hits:

First Author:Lin Li

Disigner of the Invention:胡志雄,chenjun,LUO Zhongbing,liximeng

Authorization Date:2012-02-29

Authorization number:201210049984.3

Pre One:基于声压反射系数功率谱测量超声在薄层介质中往返时间的方法

Next One:航空雷达罩蒙皮涂层厚度超声测量专用探头
Recommended MA Supervisor Institutional Repository Personal Page

Address: No.2 Linggong Road, Ganjingzi District, Dalian City, Liaoning Province, P.R.C., 116024

Click : times
  • MOBILE Version
    •
    Open time:..
    The Last Update Time:..

    Mobile phone sweep