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基于声压反射系数功率谱测量超声在薄层介质中往返时间的方法

Release Time:2022-10-19  Hits:

First Author: 林莉

Disigner of the Invention: 胡志雄,陈军,LUO Zhongbing,李喜孟

Institution: 材料科学与工程学院

Application Number: CN102607479A

Authorization Number: CN201210051117.3

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