Renke Kang
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Paper Publications
Material removal rate of 6H-SiC crystal substrate CMP using an alumina (Al 2O 3) abrasive
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Indexed by:期刊论文

Date of Publication:2012-10-01

Journal:Journal of Semiconductors

Included Journals:EI、ISTIC、Scopus

Volume:33

Issue:10

ISSN No.:16744926

Abstract:The influences of the polishing slurry composition, such as the pH value, the abrasive size and its concentration, the dispersant and the oxidants, the rotational velocity of the polishing platen and the carrier and the polishing pressure, on the material removal rate of SiC crystal substrate (0001) Si and a (0001) C surface have been studied based on the alumina abrasive in chemical mechanical polishing (CMP). The results proposed by our research here will provide a reference for developing the slurry, optimizing the process parameters, and investigating the material removal mechanism in the CMP of SiC crystal substrate. ? 2012 Chinese Institute of Electronics.

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Supervisor of Doctorate Candidates
Supervisor of Master's Candidates

Title : 国际磨粒技术学会(International Committee of Abrasive Technology, ICAT)委员,中国机械工程学会极端制造分会副主任、生产工程分会常务委员、微纳米制造技术分会常务委员,中国机械工程学会生产工程分会磨粒加工技术专业委员会副主任、切削加工专业委员会常委委员、精密工程与微纳技术专业委员会常委委员,中国机械工程学会特种加工分会超声加工技术委员会副主任,中国机械工程学会摩擦学分会微纳制造摩擦学专业委员会常务委员,中国机械工业金属切削刀具协会切削先进制造技术研究会常务理事、对外学术交流工作委员会副主任、切削先进制造技术研究会自动化加工技术与系统委员会副主任。

Gender:Male

Alma Mater:西北工业大学

Degree:Doctoral Degree

School/Department:机械工程学院

Discipline:Mechanical Manufacture and Automation. Mechatronic Engineering. Manufacturing Engineering of Aerospace Vehicle

Business Address:机械工程学院7191

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