u4naUzHQltPg8lxnVt9kDbpmhllO1JZdLSnfPIVLbYL9UmulD7btRdQ4ylPc
Current position: Home >> Scientific Research >> Paper Publications

Structural and electrical properties of ZnO films on freestanding thick diamond films

Release Time:2019-03-10  Hits:

Indexed by: Journal Article

Date of Publication: 2008-10-01

Journal: CHINESE SCIENCE BULLETIN

Included Journals: Scopus、SCIE

Volume: 53

Issue: 19

Page Number: 2931-2934

ISSN: 1001-6538

Key Words: ZnO; diamond; MOCVD

Abstract: In this paper, ZnO films are deposited on freestanding thick diamond films (FTDF) by plasma-assisted metal organic chemical vapour deposition (MOCVD). Diethyl zinc (DEZn), O(2) and N(2)O are applied as precursors and different substrate temperatures are used to achieve high quality ZnO films. The influence of substrate temperature on the properties of ZnO films is systematically investigated by X-ray diffraction (XRD), Hall measurements and electron probe microanalysis (EPMA). Experimental results demonstrate that ZnO films deposited at 600 degrees C and 73 Pa display a fine electrical quality and Zn/O atomic ratio plays an important role in the electrical property of ZnO films.

Prev One:基片温度对金刚石上沉积ZnO薄膜特性的影响

Next One:自持金刚石厚膜上沉积生长ZnO薄膜及发光特性