梁红伟   

Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates

Academic Titles: 集成电路学院院长

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Language:English
  • 中文

Paper Publications

Study of the thermal stability of the H-related donors in high resistivity ZnO:Cu thin films by high-pressure H-2 treatment

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Indexed by:Journal Article

Date of Publication:2013-07-30

Journal:CHEMICAL PHYSICS LETTERS

Included Journals:EI、SCIE

Volume:579

Page Number:90-93

ISSN:0009-2614

Abstract:High resistivity ZnO:Cu thin films were fabricated on c-plane sapphire substrate by low pressure metal-organic chemical vapor deposition (MOCVD). The samples were treated in H-2 ambient at high pressure and the thermal stability of the hydrogen-related donor-like defects was studied. Hall-effect measurement results presented that the high resistivity ZnO:Cu samples turn into n-type conductivity after H incorporation. The annealing results indicated that the hydrogenated ZnO:Cu could not recover high resistivity even after annealed at 750 degrees C. It is proposed that some unknown H-related donor-like defects still exist in the film after annealing. (C) 2013 Elsevier B.V. All rights reserved.

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