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Indexed by:期刊论文

Date of Publication:2012-02-29

Journal:VACUUM

Included Journals:SCIE、EI

Volume:86

Issue:8,SI

Page Number:1102-1106

ISSN No.:0042-207X

Key Words:Low temperature; InN; Glass substrates; ECR-PEMOCVD

Abstract:High quality InN films are deposited with an interlayer of high c-orientation (002) AZO (Aluminium-doped Zinc Oxide; ZnO:Al) films on glass substrates by electron cyclotron resonance plasma-enhanced metal organic chemical vapor deposition (ECR-PEMOCVD) at low temperature. AZO films used as a buffer layer are effective for the epitaxial growth of InN films. The influence of Trimethyl Indium (TMIn) flux on the properties of InN films is systematically investigated by reflection high energy electron diffraction (RHEED), X-ray diffraction analysis (XRD), atomic force microscopy (AFM) and optical transmittance spectra. The results indicate that high quality InN films with high c-orientation and small surface roughness are successfully achieved at an optimized Trimethyl Indium (TMIn) flux of 5.5 sccm. The InN/AZO structures have great potential for the development of full spectra solar cells. (C) 2011 Elsevier Ltd. All rights reserved.