谭毅Yi Tan

教授

 博士生导师  硕士生导师
学位:博士
性别:男
毕业院校:东京工业大学
所在单位:材料科学与工程学院
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论文成果

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Investigation on the removal of B impurity in metallurgical grade Si by electron beam melting

发布时间:2020-05-15 点击次数:

论文类型:会议论文
收录刊物:EI、Scopus
卷号:675 677
页面范围:29-32
摘要:The growth in the solar energy technology caused inshortage solar grade Si. As a lowcost, environmental friendly technology, metallurgical method purity silicon is developed significantly. However, as a typical impurity in Si, B is difficult to be removed by directional refining or vacuum melting due to its large segregation coefficient and less evaporation coefficient. In this paper, the big difference of evaporation pressure between Si and B can be applied to separate B from Si, in which, B is remained in molten Si, while most of Si becomes evaporant. Electron beam is applied to scan molten Si and the Si existed in the form of the evaporant is gather on the watercooled crystallizer. The content B in the evaporant is undetectable by ICP-MS. ? (2011) Trans Tech Publications.