Current position: Home >> Scientific Research >> Patents

一种II-VI族软脆晶体超精密加工样品的定点原子成像方法

Release Time:2019-03-09  Hits:

First Author: 张振宇

Disigner of the Invention: Dongming Guo,张念民,霍艳霞

Application Number: CN201210104895.4

Authorization Date: 2012-04-11

Authorization Number: CN102621169A

Prev One:一种半导体晶圆高效纳米精度减薄方法

Next One:一种超细磨粒纳米磨削制备纳米颗粒方法