Release Time:2019-03-11  Hits:

Indexed by: Journal Article

Date of Publication: 1992-01-01

Journal: 大连理工大学学报

Included Journals: CSCD、PKU

Volume: 32

Issue: 4

Page Number: 483

ISSN: 1000-8608

Key Words: 逻辑电路; 均匀性; 误差理论

Abstract: Comparing the theoretical ana1ysis with the experimental results the authors have proved that the uniformity of linear "and/or" gates mainly depends on imput voltage and load resistance. When imput voltage is low, the uniformity changes a little with the load resistance. When imput voltage is high, the smaller the load resistance is, the more obviously the uniformity changes with imput voltage.