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Indexed by:期刊论文

Date of Publication:1992-01-01

Journal:大连理工大学学报

Included Journals:PKU、CSCD

Volume:32

Issue:4

Page Number:483

ISSN No.:1000-8608

Key Words:逻辑电路; 均匀性; 误差理论

Abstract:Comparing the theoretical ana1ysis with the experimental results the authors have proved that the uniformity of linear "and/or" gates mainly depends on imput voltage and load resistance. When imput voltage is low, the uniformity changes a little with the load resistance. When imput voltage is high, the smaller the load resistance is, the more obviously the uniformity changes with imput voltage.