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Surface topography measurement of plasma-facing materials by dual-wavelength phase-shifting speckle interferometry technique

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Indexed by:期刊论文

Date of Publication:2018-01-01

Journal:OPTICAL ENGINEERING

Included Journals:SCIE、EI

Volume:57

Issue:1

ISSN No.:0091-3286

Key Words:speckle interferometry; dual-wavelength; topography measurement; multistep phase-shifting; tokamak

Abstract:A dual-wavelength phase-shifting speckle interferometry approach has been proposed to diagnose the topography of plasma-facing materials (PFMs) in tokamak. The conventional speckle interferometric surface measurement, which uses single-wavelength, can offer excellent vertical resolution, but limitation in measuring large height step and phase ambiguity would occur during their application. To solve the problem, a dual-wavelength method was developed. Experiments were conducted on molybdenum (Mo) sample, which is related to PFMs of experimental advanced superconducting tokamak (EAST), and a laser ablation method was adopted to simulate the erosion happed on PFMs. The laser ablation craters were measured by both single-wavelength and dual-wavelength phase-shifting speckle interferometry, and a multistep phase-shifting method has been investigated for their effectiveness on reducing noise in calculating the phase map. This work demonstrates the superiority of the dual-wavelength speckle interferometry and the feasibility of applying the measurement system in topographic measurement of PFMs in EAST. (c) 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)

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