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一种利用单端口阻抗和灵敏度测量耦合线圈参数的方法

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First Author:Chen Xiyou

Disigner of the Invention:周宇翔,muxianmin,Guanlin Li,张泽然

Application Number:CN201510992969.6

Authorization Date:2015-12-25

Authorization number:CN105653848A

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