Current position: Home >> Scientific Research >> Patents

一种测量忆阻器失电电阻值的装置及方法

Release Time:2019-10-12  Hits:

First Author: Guanlin Li

Disigner of the Invention: Chen Xiyou,牟宪民

Application Number: CN201310163087.X

Authorization Date: 2013-05-04

Authorization Number: CN103257276A

Prev One:一种应用于无桥式SEPIC-PFC电路的单周期控制方法

Next One:基于交流电源的测量忆阻器失电电阻值的装置及方法