location: Current position: Home >> Scientific Research >> Paper Publications

Improved On-Resistance and Breakdown Voltage Vertical GaN-based Field Effect Transistors

Hits:

Date of Publication:2022-10-03

Journal:2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)

Page Number:1101-1103

Pre One:High-temperature performance of gallium-nitride-based pin alpha-particle detectors grown on sapphire substrates

Next One:Improved quality of GaN epilayer grown on porous SiC substrate by in situ H-2 pre-treatment