Release Time:2024-04-29 Hits:
Date of Publication: 2022-10-03
Journal: CERAMICS INTERNATIONAL
Volume: 42
Issue: 2
Page Number: 2642-2647
ISSN: 0272-8842
Prev One:The Rayleigh law in silicon doped hafnium oxide ferroelectric thin films
Next One:Thickness-dependent phase evolution and dielectric property of Hf0.5Zr0.5O2 thin films prepared with aqueous precursor