Current position: Home >> Scientific Research >> Paper Publications

Effect of cupric ion concentration on the etching behavior of copper in Electrogenerated Chemical Polishing (EGCP)

Release Time:2019-02-15  Hits:

Indexed by: Journal Papers

Date of Publication: 2019-01-01

Journal: Precision Engineering

Included Journals: EI、SCI

Volume: 55

Page Number: 70-76

Attachments

Prev One:Effect of cupric ion concentration on the etching behavior of copper in Electrogenerated Chemical Polishing (EGCP)

Next One:Analytical Elastic Plastic Cutting Model for Predicting Grain Depth-of-Cut in Ultrafine Grinding of Silicon Wafer