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ZnO-Based Transparent Thin-Film Transistors with MgO Gate Dielectric Grown by in-situ MOCVD

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Indexed by:期刊论文

Date of Publication:2010-01-01

Journal:Chinese Physics Letters

Included Journals:ISTIC

Volume:27

Issue:12

Page Number:128504-128504

Pre One:氧源对氧化锌薄膜基本性质的影响
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