location: Current position: Home >> Scientific Research >> Paper Publications

Growth and large-scale assembly of InAs/InP core/shell nanowire: effect of shell thickness on electrical characteristics

Hits:

Indexed by:期刊论文

Date of Publication:2013-06-21

Journal:NANOTECHNOLOGY

Included Journals:SCIE、EI、PubMed、Scopus

Volume:24

Issue:24

Page Number:245306

ISSN No.:0957-4484

Abstract:InAs/InP core/shell nanowires with different shell thicknesses were grown by a two-step method, and large-scale assembly of single nanowire was realized by using dielectrophoresis alignment and patterned grooves. Thousands of single nanowire field-effect transistors were fabricated on a single chip. The effect of InP shell thickness on the electron mobility and density of InAs nanowires are experimentally investigated and discussed.

Pre One:Enhancement and tunability of Fano resonance in symmetric multilayer metamaterials at optical regime

Next One:Highly sensitive fiber pressure sensor based on off-center diaphragm reflection