location: Current position: Home >> Scientific Research >> Paper Publications

Effect of metal impurities concentration on electrical properties in N-type Recharged-Czochralski silicon

Hits:

Journal:Solar Energy Materials and Solar Cells

Volume:260

ISSN No.:0927-0248

Pre One:Numerical Simulation on Electron Beam Smelting Temperature Field of Novel Ni–Co-Based Superalloy

Next One:Oxide unlocking electron beam melting to separate boron for impurities co-removal of metallurgical grade silicon