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一种基于斜入射超声合成孔径聚焦的厚壁结构缺陷检测方法

Release Time:2019-10-22  Hits:

First Author: 林莉

Disigner of the Invention: 雷明凯,郭彦辉,金士杰,张侃

Application Number: CN201610375312.X

Authorization Date: 2016-05-31

Authorization Number: CN106093205A

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