Release Time:2019-03-10  Hits:

Indexed by: Journal Article

Date of Publication: 2008-02-01

Journal: SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Included Journals: EI、SCIE

Volume: 23

Issue: 2

ISSN: 0268-1242

Abstract: ZnO film was grown on a heavily phosphor-doped n(+)-Si substrate by metal-organic chemical vapor deposition technology. X-ray photoelectron spectroscopy measurements indicate that a two-layer structure, comprised of a phosphor-doped ZnO layer and an un-doped ZnO layer, was formed during the diffusion process of phosphor from the n(+)-Si substrate. The current-voltage characteristic exhibited significant rectifying behavior with low-leakage current for this device. The distinct defect-related blue-white electroluminescence was observed, the origin of which was confirmed to be from the ZnO p-n homojunction.