Indexed by:期刊论文
Date of Publication:2015-01-01
Journal:光电子·激光
Included Journals:Scopus、EI、PKU、CSCD
Volume:26
Issue:11
Page Number:2187-2192
ISSN No.:1005-0086
Key Words:时域相位去包裹; 灵敏度; 相位测量轮廓术(PMP)
Abstract:针对时域相位去包裹方法在三维形貌测量时存在采集图像幅数多、数据量大和处理时间长等问题,提出了一种改进的两步时域相位去包裹算法。首先,增加中间灵敏
度投影条纹,将不同灵敏度光栅条纹投射到待测物体表面,由CCD相机采集;再通过不同灵敏度级联,得到最终灵敏度系数G值较大的去包裹相位数据。推导了两
步时域相位去包裹算法的初始相位条件。并进行了实际测量。结果表明,本文方法可实现高灵敏度三维形貌测量,测量结果精度更高。
Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Gender:Male
Alma Mater:Dalian University of Technology (DUT)
Degree:Doctoral Degree
School/Department:State Key Laboratory of Industrial Equipment for Structral Analysis, Department of Engineering Mechanics
Discipline:Solid Mechanics. Applied and Experimental Mechanics. Engineering Mechanics. Mechanical Manufacture and Automation. Vehicle Engineering. Aerospace Mechanics and Engineering. mechanics of manufacturing process
Business Address:Room 321, Department of Engineering Mechanics
Contact Information:Tel.: 86 0411-84708406 Email: leizk@dlut.edu.cn
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