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无相位去包裹的微分法三维形貌测量
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Indexed by:期刊论文

Date of Publication:2015-01-01

Journal:光电子·激光

Included Journals:Scopus、EI、PKU、CSCD

Volume:26

Issue:8

Page Number:1549-1552

ISSN No.:1005-0086

Key Words:相位测量轮廓术(PMP); 相移法; 相位去包裹; 线积分; 泊松方程; 偏导数

Abstract:提出了一种无需相位去包裹的微分算法,应用于投影栅三维形貌测量。首先由计算机设计并生成4幅四步相移正弦条纹图,利用DLP投影仪将其投影到待测物体上
   ;然后由CCD相机采集受待测物体面型调制的变形光栅条纹图。再利用4幅四步相移变形条纹图,经数值运算求得沿水平和垂直方向上待测物体相位的偏导数,而
   相位偏导数的积分过程相当于求解泊松方程,于是利用离散余弦变换(DCT)求解泊松方程就可得到待测物体三维形貌对应的相位数据,从而重构待测物体的三维
   形貌。测量结果表明,相位解调的标准差小于0.0317 rad,验证了本文方法的有效性。

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Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates

Gender:Male

Alma Mater:Dalian University of Technology (DUT)

Degree:Doctoral Degree

School/Department:State Key Laboratory of Industrial Equipment for Structral Analysis, Department of Engineering Mechanics

Discipline:Solid Mechanics. Applied and Experimental Mechanics. Engineering Mechanics. Mechanical Manufacture and Automation. Vehicle Engineering. Aerospace Mechanics and Engineering. mechanics of manufacturing process

Business Address:Room 321, Department of Engineering Mechanics

Contact Information:Tel.: 86 0411-84708406 Email: leizk@dlut.edu.cn

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