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论文类型： 期刊论文

发表时间： 2016-06-01

发表刊物： MATERIALS LETTERS

收录刊物： SCIE、EI

卷号： 172

页面范围： 211-215

ISSN号： 0167-577X

关键字： Thermomigration; Metals and alloys; Diffusion; Synchrotron radiation; Finite element method; Intermetallic alloys and compounds

摘要： The thermal gradient induced intermetallic compound growth at the cold side of the Cu/Sn/Cu and Cu/Sn-3.5Ag/Cu solders heated at 350 degrees has been in situ studied using synchrotron radiation imaging technique. Finite element model for thermotransport of Cu from hot end to cold end in Cu/Sn/Cu solder is implemented for the description of the associated growth of the compound. Higher temperature and bigger solder volume are observed as favorable parameters for the rate of thickness increase in both Sn and SnAg solders. In case of SnAg system, the formation of Ag3Sn particle, causing retardation effects in the growth of Cu6Sn5 compound, subsequently induces a lowered resulting thickness. (C) 2016 Elsevier B.V. All rights reserved.