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Influence of Ar/H-2 ratio on the characteristics of boron-doped nc-Si:H films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition

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Date of Publication:2022-10-03

Journal:SURFACE COATINGS TECHNOLOGY

Volume:228

Issue:SUPPL.1

Page Number:S412-S415

ISSN No.:0257-8972

Next One:Influence of Ar/H-2 ratio on the characteristics of phosphorus-doped hydrogenated nanocrystalline silicon films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition