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Indexed by:会议论文

Date of Publication:2013-08-04

Included Journals:EI、Scopus

Volume:3

Page Number:2593-2598

Abstract:The synchrotron radiation imaging technique has been applied to in situ observed the formation process of an Al/Cu bimetal by using the 3rd generation synchrotron X-ray source, Shanghai Synchrotron Radiation Facility (SSRF). We focus on the growth behavior and morphology evolution of bimetal interface in the Al/Cu bimetal, visualized by absorption and phase contrast radiography at SSRF in real time. Based on a series of animated frames and further image processing, some physical and dynamical phenomena, such as grain growth, solute diffusion, intermetallic compound formation within the transition area of bimetal interface were analyed. The in situ observations also provide theoratical foundernatals for improving the existing methods of bimetal preparation or developing the new ones.