董闯

个人信息Personal Information

教授

博士生导师

硕士生导师

性别:男

毕业院校:法国洛林国立综合理工学院

学位:博士

所在单位:材料科学与工程学院

电子邮箱:dong@dlut.edu.cn

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Control of microstructures and properties of dc magnetron sputtering deposited chromium nitride films

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论文类型:期刊论文

发表时间:2008-01-08

发表刊物:VACUUM

收录刊物:SCIE、EI

卷号:82

期号:5

页面范围:501-509

ISSN号:0042-207X

关键字:Cr-N coatings; control; DC magnetron sputtering; adhesion; tribology

摘要:Chromium nitride coatings have been prepared by a conventional DC magnetron reactive sputtering process in nitrogen-argon mixed atmospheres. The sputtering pressure and target voltage versus nitrogen flow rate curves were established in order to control the structures and properties of chromium nitride coatings. A good correspondence among the sputtering pressure, target voltage evolutions and the phase developments with respect to nitrogen flow rate has been found. The stoichiometric Cr2N and CrN coatings were confirmed by EPMA and XRD analysis. Cryogenic fracture cross-section SEM images show columnar growth morphologies. Stoichiometric chromium nitrides present high hardness and elastic modulus as well as high H-3/E-2 ratio in a nano-indenter test. Adhesion and tribological properties were evaluated by scratch and pin-on-disk tests, respectively. Chromium nitrides present normal adhesion failure critical load (Lc(2)) between 10 and 20N and friction coefficients ranging from 0.5 to 0.75. (c) 2007 Elsevier Ltd. All rights reserved.