Indexed by:Journal Papers
Document Code:602957
Date of Publication:2026-01-01
Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics
ISSN:2168-6777
Key Words:Double-pulse testing; Dynamic on-resistance; Multi-pulse testing; Recessed-gate enhancement-mode GaN HEMT
Assistant Professor
Supervisor of Master's Candidates
Gender:Female
Alma Mater:湖南大学
Degree:Doctoral Degree
School/Department:光电工程与仪器科学学院
Discipline:Measuring Technology and Instrument. Power Electronics and Electrical Drives
Business Address:厚望楼206
Browse on mobile
Open Time:..
The Last Update Time:..
