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  • 梁红伟 ( 教授 )

    的个人主页 http://faculty.dlut.edu.cn/kid/zh_CN/index.htm

  •   教授   博士生导师   硕士生导师
  • 主要任职:集成电路学院院长
论文成果 当前位置: 中文主页 >> 科学研究 >> 论文成果
Structural, morphological, FTIR and photoluminescence properties of gallium oxide thin films

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论文类型:期刊论文
发表时间:2014-05-01
发表刊物:JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
收录刊物:SCIE、EI
卷号:32
期号:3
ISSN号:1071-1023
摘要:Thin films of beta-Ga2O3 are prepared on sapphire substrates via electron beam evaporation and annealed at 1000 degrees C for 1 h. The effect of the annealing treatment upon the crystal structures, surface morphologies, and optical properties of beta-Ga2O3 films are investigated by x-ray diffraction, scanning electron microscopy, atomic force microscopy, Fourier transform infrared spectroscopy, and photoluminescence and optical transmittance spectra. The easily prepared beta-Ga2O3 films present a mixed structure of amorphous and crystalline phases. The annealed beta-Ga2O3 films exhibit a clear absorption edge in the deep ultraviolet region. Ultraviolet and red emissions are also observed in the photoluminescence spectra of the annealed beta-Ga2O3 films. (C) 2014 American Vacuum Society.

 

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