![]() |
个人信息Personal Information
教授
博士生导师
硕士生导师
性别:男
毕业院校:大连理工大学
学位:博士
所在单位:物理学院
学科:等离子体物理
电子邮箱:cli@dlut.edu.cn
Quantitative analysis of elemental depth on Wendelstein 7-X divertor baffle screws by picosecond laser-induced breakdown spectroscopy
点击次数:
论文类型:期刊论文
发表时间:2019-10-01
发表刊物:SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
收录刊物:EI
卷号:160
ISSN号:0584-8547
关键字:Laser-induced breakdown spectroscopy; Plasma wall interaction; Deposition layer; Fuel retention
摘要:Analysis of elemental distributions in plasma-facing components (PFCs) is vital for the study of material erosion, deposition, and fuel retention in Wendelstein 7-X (W7-X) stellarator operating in full 3D geometry. In this work, we report the results on the application of picosecond laser-induced breakdown spectroscopy (ps-LIBS) combined with laser-induced ablation quadrupole mass spectrometry (LIA-QMS) to quantitatively investigate the elemental depth distribution and fuel retention on the screws PFCs from the divertor baffle of W7-X. Depth profiles of H, C, Ti and Mo intensities on the screws with specific multilayer structures have been achieved by LIBS combined with LIA-QMS. A linear correlation approach has been applied for identifying the interface between the C layer and the Ti layer and shows that a laser ablation rate of (82.9 +/- 0.9) nm/shot can be achieved on C layer thickness measurement by a laser energy density of 6.5 J/cm(2). Moreover, quantitative H retention content on the surface of the screws with stellarator discharge plasma exposure is approximately 1.1 x 10(21) atoms/m(2) which is higher than approximately 3.5 x 10(20) atoms/m(2) on the surface of the new screw without plasma exposure. The studies well demonstrate the ability to determine elementary resolved layer thicknesses and H retention measurements by depth analysis of LIBS on PFCs exposed in W7-X.