论文成果
Quantitative analysis of elemental depth on Wendelstein 7-X divertor baffle screws by picosecond laser-induced breakdown spectroscopy
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- 论文类型：期刊论文
- 发表时间：2019-10-01
- 发表刊物：SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
- 收录刊物：EI
- 文献类型：J
- 卷号：160
- ISSN号：0584-8547
- 关键字：Laser-induced breakdown spectroscopy; Plasma wall interaction;
Deposition layer; Fuel retention
- 摘要：Analysis of elemental distributions in plasma-facing components (PFCs) is vital for the study of material erosion, deposition, and fuel retention in Wendelstein 7-X (W7-X) stellarator operating in full 3D geometry. In this work, we report the results on the application of picosecond laser-induced breakdown spectroscopy (ps-LIBS) combined with laser-induced ablation quadrupole mass spectrometry (LIA-QMS) to quantitatively investigate the elemental depth distribution and fuel retention on the screws PFCs from the divertor baffle of W7-X. Depth profiles of H, C, Ti and Mo intensities on the screws with specific multilayer structures have been achieved by LIBS combined with LIA-QMS. A linear correlation approach has been applied for identifying the interface between the C layer and the Ti layer and shows that a laser ablation rate of (82.9 +/- 0.9) nm/shot can be achieved on C layer thickness measurement by a laser energy density of 6.5 J/cm(2). Moreover, quantitative H retention content on the surface of the screws with stellarator discharge plasma exposure is approximately 1.1 x 10(21) atoms/m(2) which is higher than approximately 3.5 x 10(20) atoms/m(2) on the surface of the new screw without plasma exposure. The studies well demonstrate the ability to determine elementary resolved layer thicknesses and H retention measurements by depth analysis of LIBS on PFCs exposed in W7-X.
