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论文类型：会议论文

发表时间：2009-06-07

收录刊物：EI、CPCI-S、Scopus

页面范围：613-617

关键字：Dendritic growth; diffraction-enhanced imaging; phase contrast; synchrotron radiation

摘要：A new X-Ray imaging technique, Diffraction-Enhanced Imaging (DEI), is proposed to study on dendritic growth of Sn-Bi alloys in the first-generation Beijing Synchrotron Radiation Facility (BSRF). The imaging mechanism of DEI includes both of absorption and phase contrast. The experimental device of DEI is similar to those of previously reported methods with the exception of an additional analyzer crystal which is set between the sample and detector. The analyzer crystal can filter the noisy X-Ray which passes through the sample thus improving the image quality in detector. The solidification of Sn-Bi alloys is in-situ studied with DEI. The micro solidification phenomena such as equiaxed grain growth, columnar grain growth, columnar-equi axed transition (CET), detachment and floating of dendrite arm fragmentation, the competition of inter dendritic growth, the grain growth surrounding a small cavity and etc. can be clearly observed. The image quality acquired with DEI in 1st generation BSRF can reach or even exceed the level done in 3rd generation synchrotron facilities.