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发布时间：2026-10-13

论文类型：期刊论文

论文编号：602957

发表时间：2026-01-01

发表刊物：IEEE Journal of Emerging and Selected Topics in Power Electronics

ISSN号：2168-6777

关键字：Double-pulse testing; Dynamic on-resistance; Multi-pulse testing; Recessed-gate enhancement-mode GaN HEMT