YongXin Liu
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Spectroscopy diagnostic of dual-frequency capacitively coupled CHF3/Ar plasma
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Indexed by:期刊论文

Date of Publication:2013-11-01

Journal:PHYSICS OF PLASMAS

Included Journals:SCIE、EI、Scopus

Volume:20

Issue:11

ISSN No.:1070-664X

Abstract:A combined spectroscopic method of absorption, actinometry, and relative optical emission intensity is employed to determine the absolute CF2 density, the relative F and H densities, H atom excitation temperature and the electron density in dual-frequency (60/2 MHz) capacitively coupled CHF3/Ar plasmas. The effects of different control parameters, such as high-frequency (HF) power, low-frequency (LF) power, gas pressure, gap length and content of CHF3, on the concentration of radical CF2, F, and H and excitation temperature are discussed, respectively. It is found that the concentration of CF2 is strongly dependent on the HF power, operating pressure and the proportion of CHF3 in feed gas, while it is almost independent of the LF power and the gap length. A higher concentration ratio of F to CF2 could be obtained in dual-frequency discharge case. Finally, the generation and decay mechanisms of CF2 and F were also discussed. (C) 2013 AIP Publishing LLC.

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Gender:Male

Alma Mater:大连理工大学

Degree:Doctoral Degree

School/Department:物理学院

Discipline:Plasma physics

Business Address:大连理工大学三束材料改性教育部重点实验室3号楼201室

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